Data Acquisition card PCI 16-channels 400kSa/s Keitlhey KPCI-3104

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 16-bit resolution
• High and low programmable gains
• Input/output speeds up to 50kS/s
• Up to 17 digital lines for monitoring or control

 

• 32 optically isolated solid-state relays and digital inputs
• Direct, non-polarized switching and sensing: DC up to 60VDC, AC up to 30Vrms
• High load current capability up to 350mA

 

• 0.4 fA p-p (4E - 16 A) noise
• Remote PreAmp can be located at the signal source to minimize cable noise
• Up to 6½-digit resolution

 

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 12-bit resolution
• High and low programmable gains
• Input/output speeds up to 100kS/s
• Up to 17 digital I/O lines

 

• Make low noise measurements at high speeds
• typically just 15 nV p-p noise at 1s response time
• 40..50 nV p-p noise at 60ms

 

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

 

• Dual-channel instrument for optical power measurements, beam measurements, and nanoscale materials and device research
• ±100V source for bias requirements
• Measure photodetector current from 1fA to 20mA
• 1fA current measurement resolution

 

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• Up to 96 digital I/O lines, 64 I/O and 32 input, grouped into 12 8-bit ports

 

• 0.0025% DCV accuracy (1 year)
• 1 Msample/s digitizing, 16-bits
• 10-channel scan card option
• 100 nV
• 10 pA
• 1 µOhm

 

• 7.5 digit resolution
• 100nV rms noise floor
• 7ppm DCV repeatability