16-bit resolution
Input speeds of up to 250kS/s
Output speeds of up to 200kS/s
Digital I/O scanning speeds of up to 3MHz
32 single-ended or 16 differential analog inputs
16 digital I/O lines
2 analog outputs, waveform quality, 200kS/s
4 counter/timers
Low gain (1, 2, 4, 8)
Pre-, post, and about-triggering
1024-location channel-gain queue
32-bit DriverLINX® drivers plus a suite of bundled software including ExceLINX™, VisualSCOPE™, TestPoint™, and LabVIEW® drivers

More products Keithley PXI/PCI

SUB-FEMPTOAMP REMOTE SOURCE METER KEITHLEY 6430

• 0.4 fA p-p (4E - 16 A) noise
• Remote PreAmp can be located at the signal source to minimize cable noise
• Up to 6½-digit resolution

PROGRAMMABLE ELECTROMETER KEITHLEY 6514

• <1fA noise
• >200TO input impedance on voltage measurements
• Charge measurements from 10fC to 20µC
• High speed -- up to 1200 readings/second

5-SLOT SYSTEM DMM, DATA ACQUISITION, SWITCH, DATALOGGER KEITHLEY 2750

• Combines functions of DMM, switch system, and datalogger
• True 6½-digit (22-bit) resolution
• Choice of 12 switch/control plug-in modules
• Up to 200 differential input channels

KEITHLEY DMM7512 2-CHANNELS 7.5-DIGIT MULTIMETER

• 2 DMMs in 1U high enclosure
• 1 Msample/s, 18-bit digitizers
• 10 nV, 0.1 µΩ and 1 pA sensitivities

PRECISION AC AND DC CURRENT SOURCE KEITHLEY 6221

• Source and sink (programmable load) 100fA to 100mA
• 10^14 O output impedance ensures stable current sourcing into variable loads
• Source AC currents from 2pA to 100mA for AC characterization of components and materials

PCI BOARD DIGITAL I/O 16-CHANNELS OPTICALLY ISOLATED KEITHLEY KPCI-PDISO8A

• 16 optically isolated solid-state relays and digital inputs
• Direct, non-polarized switching and sensing: DC up to 60VDC, AC up to 30Vrms
• High load current capability up to 350mA

KEITHLEY 4200A-SCS I-V SEMICONDUCTOR CURVE TRACER PARAMETER ANALYZER

• Move C-V measurement to any device terminal without re-cabling
• User-configurable for low current capability
• Personalize the names of output channels
• View real-time test status

PULSED LASER DIODE TEST SYSTEM KEITHLEY 2520

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

PRECISION DC CURRENT SOURCE KEITHLEY 6220

• Source and sink (programmable load) 100fA to 100mA
• 10^14 O output impedance ensures stable current sourcing into variable loads

2-SLOT SYSTEM DMM, DATA ACQUISITION, SWITCH, DATALOGGER KEITHLEY 2700

• Combines functions of DMM, switch system, and datalogger
• True 6½-digit (22-bit) resolution
• Choice of 12 switch/control plug-in modules
• Up to 200 differential input channels