Simplifies laser diode LIV testing prior to packaging or active temperature control
Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
Sweep can be programmed to stop on optical power limit
Combines high accuracy source and measure capabilities for pulsed and DC testing
Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements
Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
Pulse capability up to 5A, DC capability up to 1A
14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
Measurement algorithm increases the pulse measurement's signal-to-noise ratio
Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
Digital I/O binning and handling operations
IEEE-488 and RS-232 interfaces

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