• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 16-bit resolution
• High and low programmable gains
• Input/output speeds up to 50kS/s
• Up to 17 digital lines for monitoring or control

HIGH VOLTAGE POWER SUPPLY 5 KV KEITHLEY 248

• Source voltages up to 5kV, negative or positive polarity
• Up to 5mA compliance current
• Low output ripple for precision sourcing

DATA ACQUISITION CARD PCI 32-CHANNELS 250KSA/S KEITLHEY KPCI-3116

• 16-bit resolution
• Input speeds of up to 250kS/s
• Output speeds of up to 200kS/s
• Digital I/O scanning speeds of up to 3MHz
• 32 single-ended or 16 differential analog inputs
• 16 digital I/O lines
• 2 analog outputs, waveform quality, 200kS/s

USB MODULAR DATA ACQUISITION UNIT USB 16-CHANNELS 100KSA/S KEITLHEY KUSB-3102

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 12-bit resolution
• High and low programmable gains
• Input/output speeds up to 100kS/s
• Up to 17 digital I/O lines

LOW CURRENT PHOTODIODE PICOAMMETER 2 CHANNLES KEITHLEY 2502

• Dual-channel instrument for optical power measurements, beam measurements, and nanoscale materials and device research
• ±100V source for bias requirements
• Measure photodetector current from 1fA to 20mA
• 1fA current measurement resolution

PICOAMMETER AND VOLTAGE SOURCE 5.5 DIGIT KEITHLEY 6487

• 10fA resolution
• 5-1/2 digit resolution
• <200µV burden voltage
• measure currents from 20fA to 20mA
• source voltage from 200µV to 505V

DIGITAL MULTIMETER 6.5 DIGIT AND THD AUDIO ANALYZER KEITHLEY 2015

• 6.5 digit DMM
• THD, THD+Noise and SINAD measurements
• 20Hz-20kHz sine wave generator
• 4Vrms single-ended or 8Vrms differential output
• Identifies peak spectral components(2015-P model)

SUB-FEMPTOAMP REMOTE SOURCE METER KEITHLEY 6430

• 0.4 fA p-p (4E - 16 A) noise
• Remote PreAmp can be located at the signal source to minimize cable noise
• Up to 6½-digit resolution

PULSED LASER DIODE TEST SYSTEM KEITHLEY 2520

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

LOW CURRENT PICO AMP METER 5.5 DIGIT KEITHLEY 6485

• 10fA resolution
• 5-1/2 digit resolution
• <200µV burden voltage
• measure currents from 20fA to 20mA