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• 12-bit resolution• Throughput of up to 225kS/s• Digital I/O scanning speeds of up to 3MHz• 16 single-ended or 8 differential analog inputs• 23 digital I/O lines
• 12-bit resolution• Throughput of up to 225kS/s• Digital I/O scanning speeds of up to 3MHz• 16 single-ended or 8 differential analog inputs• 23 digital I/O lines• 2 analog outputs
• 12-bit resolution• Throughput of up to 400kS/s• Digital I/O scanning speeds of up to 3MHz• 16 single-ended or 8 differential analog inputs• 23 digital I/O lines
• 12-bit resolution• Throughput of up to 400kS/s• Digital I/O scanning speeds of up to 3MHz• 16 single-ended or 8 differential analog inputs• 23 digital I/O lines• 2 analog outputs
• 12-bit resolution• Maximum sampling rate of 1.25MS/s• 32 single-ended or 16 differential analog inputs• 2 analog outputs, waveform quality, up to 500kS/s• 16 high speed digital I/O lines, up to 3MHz
• 16-bit resolution• Input speeds of up to 250kS/s• Output speeds of up to 200kS/s• Digital I/O scanning speeds of up to 3MHz• 32 single-ended or 16 differential analog inputs• 16 digital I/O lines• 2 analog outputs, waveform quality, 200kS/s
• 20mA output current without power supply• 8 analog outputs• 32 high-current digital I/O lines (user configurable)
• 20mA output current without power supply• 2 analog outputs
• 96 or 24 TTL-level compatible digital I/O lines• Bi-directional I/O• High-current driver capability, 15mA (source) and 64mA (sink)
• 16 optically isolated solid-state relays and digital inputs• Direct, non-polarized switching and sensing: DC up to 60VDC, AC up to 30Vrms• High load current capability up to 350mA
• 32 optically isolated solid-state relays and digital inputs• Direct, non-polarized switching and sensing: DC up to 60VDC, AC up to 30Vrms• High load current capability up to 350mA