USB Modular Data Acquisition Unit USB 8-channels 50kSa/s Keitlhey KUSB-3100

• 6.5 digit DMM
• Single-instrument solution for continuity and hi-pot type leakage resistance measurements
• Programmable constant V source (50-500V) supports high speed, high resistance measurements
• Programmable constant I source (0-50mA) with dry circuit clamp helps prevent device stress or damage during low resistance measurements

 

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

 

• 0.0025% DCV accuracy (1 year)
• 1 Msample/s digitizing, 16-bits
• 10-channel scan card option
• 100 nV
• 10 pA
• 1 µOhm

 

• The cost-effective 5½-digit Model 6485 Picoammeter can measure currents from 10fA to 20mA, at speeds up to 1000 readings per second.

 

• Measures resistances up to 10000TO
• 1fA - 20mA current measurement range
• <20 µV burden voltage on lowest current ranges
• 200 TO input impedance

 

• 0.0006% DCV accuracy (one year)
• 1nV, 100nΩ, and 10pA sensitivity
• DC in-circuit current and 15MHz frequency measurement

 

• 1 mHz - 165 MHz frequency output range
• 2 channels
• 3 ns - 1000 s pulse width range
• 10 V amplitude into 50 O, 20 V into 1 k O

 

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 16-bit resolution
• High and low programmable gains
• Input/output speeds up to 50kS/s
• Up to 17 digital lines for monitoring or control

 

• 12-bit resolution
• Throughput of up to 400kS/s
• Digital I/O scanning speeds of up to 3MHz
• 16 single-ended or 8 differential analog inputs
• 23 digital I/O lines

 

• 10fA resolution
• 5-1/2 digit resolution
• <200µV burden voltage
• measure currents from 20fA to 20mA