Sistem scanare/ masura emisii radiatii electromagnetice camp apropiat NoiseKen EPS-3007

Cod: NoiseKen EPS-3007


 

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Descriere

Niear field scanner system to "visualize" the inteference properties  of the circuit board

 

The EMC PRECISION SCAN is a scanner system to measure RF near-field emissions from a printed circuit board under test in normal offices or similar electromagnetic environments by utilizing an X-Y axis antenna probe scanning mechanism. The scanning results are represented on the user's PC monitor as frequency spectrum charts and field intensity distribution color maps, the latter of which is superimposed on the actual board image captured by the CCD camera mounted on the scanner main unit, allowing the user to easily locate the exact sources of emission.

 

FEATURES

  • Provides an amplitude versus frequency plot for each antenna probe position and field intensity distribution map by a single scan
  • Electric and magnetic fields are separately detected.
  • Wide and selectable frequency range
  • Fine resolution
  • 3D graphical representation and zoom capability for a given area
  • Comparison before and after a modification or improvement
  • Scanning by a single antenna probe to minimize error between each measurement point
  • 3GHz maximum frequency response (option)
  • Standard included three kinds of antenna probes (Probe A, Probe B and Probe C)
  • Simple and easy-to use

 

APPLICATIONS

This product is now used in the following applications. Our company is continuously developing various new applications in cooperation with our customers. For example:

 

  • Locates spots with higher field level compared to other spots
  • Locates spots with the frequency or frequency range in question, if any
  • Comparison of measurements resutls between before and after modifications in circuit design
  • Measurement for components
  • Evaluates the effectivness of EMI suppression components
  • Measurement for I/O cables
  • Measurement for the surface of small metal enclosure

 

 

SPECIFICATIONS

 

Main unit/Controller
 

Scanning method

Scanning of micro-electromagnetic field probe by XY stage

Analysis of detection signal

Analysis using spectrum analyzer

Frequency response

30MHz ~ 1.5GHz (standard)
30MHz ~ 3GHz (Option)

Low Frequency response (option)

150kHz ~ 100MHz

Control method

Control by personal computer
GP-IB interface, pulse motor control, image control

Scanning area

300 (length) x 350mm (Width) maximum

Scanning resolution

1.0mm x 1.0 mm (depending on an antenna probe)

Minimum scanning step

1mm/0.1mm step

Power supply

AC95~120, 210~250V 50/60Hz, 150VA

Dimensions and weight

(W) 601 x (H) 980 x (D) 662mm

Weight

Approx. 37kgs

Scanning probes

Probe A (for vertical magnetic field) , Probe B (for horizontal magnetic field), Probe C (for electric field)

Function

Scanning frequency range setting, Comparison, Filing and printing the measured data, Emission spectrum display, Search of source of maximum noise emission, Display of the emission intensities from the PCB under test, Synthesization of the emission data and overlaid on real-time image of the PCB



Personal Computer (Required specifications)

 

Compatible machine

IBM PC-AT compatible machine running the Windows® XP
Recommended CPU: Pentium® ?233MHz or higher
Main memory: 128M byte or more recommended
HDD: 100MB or more (dependinng on scanning data quantity)
Display mode: SVGA or XGA

OS

Microsoft® Windows®XP, WindowsVista®, Windows7®

Software

DirectX® version 2.0 after is necessary. (Direct® version 5.0 is recommended.)
Used for 3D display.

Expansion Slots

2 x full height PCI slots (for the Pulse Motor Board and the Video Board)
1 x full height PCIe slot or USB  (for the GP-IB Board)

Expansion Board

GP-IB Board (Using IRQ)
Pulse Motor Board (Not using IRQ)
Video Board (Using IRQ)



Measurement function

 

System of unit

Level: dBµV/dBm, Frequency: MHz (Linear scale)

Compatible spectrum analyzer

Agilent Technologies: E4402B
ADVANTEST: U3741
Anritsu: MS2661C

Please consult with our company about other supported analyzers.

 

Alte produse NOISEKEN

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• INS-4020 (2kV) : 0.01 ~ 2.00KV ±10% with 50 ohm load, 10V step
• INS-4040(4kV) : 0.01 ~ 4.00KV ±10% with 50 ohm load, 10V step
• Automatic ramp operation for output voltage, phase angle and repetition period
• Floating output
• Coupling mode selection by plugging the supplied coaxial connector to the selected port
• Easily changeable mercury relay unit

 

SIMULATOR IMPULSURI INALTA TENSIUNE ECHIPAMENTE ILUMINAT NOISEKEN LSS-F02

• "Output voltage 15kV, current 7500A" which can conduct breakdown resistibility test
• "50% reduction of the output interval" which can drastically reduce the test time
• "Touch-panel" adopted for the easy test setting
• "Multi-languages" for the easy operation processing available
• "Indicator" which is linked with the test setting equipped
• PC control available with the optional software
• "Emergency stop" & "Interlock terminal" which secure the test operator equipped

 

SIMULATOR IMPULSURI ZGOMOT TESTARE EMC NOISEKEN INS-AX2

• INS-AX2-220/250 : 0.01 ~ 2.00kV±10% at 0.01kV step Pulse output voltage
• INS-AX2-420/450 : 0.01 ~ 4.00kV±10% at 0.01kV step Pulse output voltage
• Floating output
• 8 pulse widths installed: 10ns, 50ns, 100ns, 200ns, 400ns, 500ns, 800ns and 1000ns
• Internal switchable terminators
• Easily changeable and safety-interlocked outlet panel (EUT interface)
• 3 channels EUT fail input

 

SIMULATOR IMPULSURI INALTA TENSIUNE ECHIPAMENTE DE ILUMINARE NOISEKEN LSS-6230

• Lightning Surge Simulator conforming to IEC61000-4-5 ed2 Standard
• Ring wave conforming to ANSI/IEEE C62.45 available
• Max. voltage 6.6kV output focusing on the practical use
• Monitor terminal standard equipped so as for easy waveform pre-checking
• Interlock built-in as the emergency stop function for safety

 

SIMULATOR DESCARCARE ELECTROSTATICA CIRCUITE SEMICONDUCTOARE ESD NOISEKEN ESS-6002/ 6008

• ESS-6002 Output voltage: 10V ~2.0kV ±10% (1V step)
• ESS-6008 Output voltage: 100V ~ 8.0 kV±10% (10V step)
• A simple probe stand and test fixture plus a pair of miniature test leads
• Narrow pitch DUT can be tested in semi-automatic manner
• Each probe has a coaxial interface with an external measuring instrument.

 

SURSA-SIMULATOR CRESTERI/ CADERI DE TENSIUNE NOISEKEN VDS-1007/ 2007

• VDS-1007 : 1kVA Power
• VDS-2007 : 2kVA Power
• Enable to enrich EMC preliminary tests with the remote control as an AC stabilizing power source
• Enable IEC61000-4-11/13/14/28 precompliant tests
• Usable to be power source for IEC61000-3-2-2 precompliant measurement

 

GENERATOR IMPULSURI 3A, 3B SIMULARE TRANIZITORII TESTARE EMC AUTOMOTIVE NOISEKEN ISS-7630

• Pulse 3a and Pulse 3b generating unit
• A built-in 60V/30A Coupling Network allows independent operation.
• <3.5ns rise time pulse available
• Runs in pulse repetition frequencies sweep mode from 1 kHz to 100 kHz (ISS-7601 software required)


SIMULATOR EVENIMENTE TRANZITORII RAPIDE DECLANSATE NOISEKEN FNS-AX3

• 4.8kV maximum peak voltage
• 2MHz pulse repetition rate
• Conforming to IEC/EN 61000-4-4 (Second Edition-2004)
• Reverse polarity per burst
• Automatic ramp operation
• Manual, IEC level and sequence modes

 

GENERATOR IMPULSURI 2B, 4 SIMULARE TRANIZITORII TESTARE EMC AUTOMOTIVE NOISEKEN BP4610

• Pulse 2b and Pulse 4 generating unit
• +-60V 10A DC - 150kHz built-In bipolar amplifier
• Functions as the DUT power supply for testing with the other pulses
• Upgradeable to 15A or 30A by use of an optional external power supply


SISTEM SCANARE/ MASURA EMISII RADIATII ELECTROMAGNETICE CAMP APROPIAT NOISEKEN EPS-3007

• Provides an amplitude versus frequency plot for each antenna probe position and field intensity distribution map by a single scan
• Electric and magnetic fields are separately detected
• 3D graphical representation and zoom capability for a given area
• Comparison before and after a modification or improvement
• Scanning by a single antenna probe to minimize error between each measurement point
• 3GHz maximum frequency response (option)
• Standard included three kinds of antenna probes (Probe A, Probe B and Probe C)