Electrometer High Resistance Meter Keithley 6517B

• 6.5 digit DMM
• Single-instrument solution for continuity and hi-pot type leakage resistance measurements
• Programmable constant V source (50-500V) supports high speed, high resistance measurements
• Programmable constant I source (0-50mA) with dry circuit clamp helps prevent device stress or damage during low resistance measurements

 

• Dual-channel instrument for optical power measurements, beam measurements, and nanoscale materials and device research
• ±100V source for bias requirements
• Measure photodetector current from 1fA to 20mA
• 1fA current measurement resolution

 

• 16-bit resolution
• Input speeds of up to 250kS/s
• Output speeds of up to 200kS/s
• Digital I/O scanning speeds of up to 3MHz
• 32 single-ended or 16 differential analog inputs
• 16 digital I/O lines
• 2 analog outputs, waveform quality, 200kS/s

 

• 7.5 digit true resolution
• 8k Memory(optional 32k or 128k)
• Exceptional measurement integrity with high speed
• Broad range of built-in measurement functions

 

• 96 or 24 TTL-level compatible digital I/O lines
• Bi-directional I/O
• High-current driver capability, 15mA (source) and 64mA (sink)

 

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 12-bit resolution
• High and low programmable gains
• Input/output speeds up to 100kS/s
• Up to 17 digital I/O lines

 

• Highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meter
• Offers best-in-class performance with 6½-digit resolution.

 

• Make low noise measurements at high speeds
• typically just 15 nV p-p noise at 1s response time
• 40..50 nV p-p noise at 60ms

 

• 20mA output current without power supply
• 2 analog outputs

 

• 12-bit resolution
• Maximum sampling rate of 1.25MS/s
• 32 single-ended or 16 differential analog inputs
• 2 analog outputs, waveform quality, up to 500kS/s
• 16 high speed digital I/O lines, up to 3MHz