The 2650 Series High Power SourceMeter SMU Instruments are designed specifically for characterizing and testing high voltage/current electronics and power semiconductors, such as diodes, FETs, and IGBTs, high brightness LEDs, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies. They deliver unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. Two instruments are available offering up to 3000V or up to 2000W of pulse current power.

Features

Benefits

Highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current metersOffers best-in-class performance with 6½-digit resolution.

Source or sink (2651A) up to 2,000W of pulsed power (±40V, ±50A) or up to 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A); easily connect two units (in series or parallel) to create solutions up to ±100A or ±80VSupports characterization/testing of power semiconductors, HBLEDs, optical devices, solar cells, and GaN, SiC, and other compound materials and devices. Applications include semiconductor junction temperature characterization; high speed, high precision digitization; electromigration studies; and high current, high power device testing.

Source or sink (2657A) up to 180W of DC or pulsed power (±3000V@20mA, ±1500V@120mA)Provides the high voltage required for power semiconductor device characterization and testing, including GaN, SiC, and other compound materials and devices, breakdown and leakage testing to 3kV, and characterization of sub-millisecond transients.

Built-in web browser based softwareAllows for remote control through any browser, on any computer, from anywhere in the world.

Choice of digitizing or integrating measurement modesSupports characterizing transient and steady-state behavior precisely, including rapidly changing thermal effects.

TSP (Test Script Processing) technologyAvoids communication delays between the PC controller and instrument by embedding test scripts in the instrument itself, improving test throughput dramatically.

TSP-Link channel expansion busEnables multiple 2651As and 2657As and selected Series 2600B SMU instruments to be combined to form an integrated system with up to 32 channels.

Python Drivers SupportHarness the power of native Python commands for controlling instruments and eliminate tedious manual parsing. At your fingertips you’ll find your favorite IDE, such as VS Code or PyCharm. Learn more.

Compatible with Model 8010 High Power Device Test Fixture and Model 8020 High Power Interface PanelProvides safe and easy connections for testing high power devices at either the packaged part or wafer level.

Optional ACS Basic semiconductor component characterization softwareMaximizes productivity when performing packaged part characterization during development, quality verification, or failure analysis.

ModelChannelsMax Current Source/Measure RangeMax Voltage Source/Measure RangeMeasurement Resolution (Current / Voltage)PowerList PriceConfigure And Quote

2651A150A40V100fA / 100nV2000 W32.900,00 €

2657A1120mA3000V1fA / 100nV180 W39.600,00 €

More products KEITHLEY

USB MODULAR DATA ACQUISITION UNIT USB 16-CHANNELS 50KSA/S KEITLHEY KUSB-3108

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 16-bit resolution
• High and low programmable gains
• Input/output speeds up to 50kS/s
• Up to 17 digital lines for monitoring or control

KEITHLEY 2002 8.5-DIGIT PRECISION MULTIMETER

• 0.0006% DCV accuracy (one year)
• 1nV, 100nΩ, and 10pA sensitivity
• DC in-circuit current and 15MHz frequency measurement

ELECTROMETER HIGH RESISTANCE METER KEITHLEY 6517B

• Measures resistances up to 10000TO
• 1fA - 20mA current measurement range
• <20 µV burden voltage on lowest current ranges
• 200 TO input impedance

DATA ACQUISITION CARD PCI 32-CHANNELS 250KSA/S KEITLHEY KPCI-3116

• 16-bit resolution
• Input speeds of up to 250kS/s
• Output speeds of up to 200kS/s
• Digital I/O scanning speeds of up to 3MHz
• 32 single-ended or 16 differential analog inputs
• 16 digital I/O lines
• 2 analog outputs, waveform quality, 200kS/s

LOW VOLTAGE NANOVOLTMETER KEITHLEY 2182A

• Make low noise measurements at high speeds
• typically just 15 nV p-p noise at 1s response time
• 40..50 nV p-p noise at 60ms

DIGITAL PRECISION MULTIMETER 8.5 DIGIT KEITHLEY DMM 2002

• 8.5 digit true resolution
• 8k Memory(optional 32k or 128k)
• Exceptional measurement integrity with high speed
• Broad range of built-in measurement functions

DATA ACQUISITION CARD PCI 16-CHANNELS 400KSA/S KEITLHEY KPCI-3104

• 12-bit resolution
• Throughput of up to 400kS/s
• Digital I/O scanning speeds of up to 3MHz
• 16 single-ended or 8 differential analog inputs
• 23 digital I/O lines
• 2 analog outputs

USB MODULAR DIGITAL I/O 96-CHANNELS KEITLHEY KUSB-3160

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• Up to 96 digital I/O lines, 64 I/O and 32 input, grouped into 12 8-bit ports

DIGITAL SOURCE METER 6.5 DIGIT AIRBAG TEST SYSTEM KEITHLEY DMM 2000

• 6.5 digit DMM
• Single-instrument solution for continuity and hi-pot type leakage resistance measurements
• Programmable constant V source (50-500V) supports high speed, high resistance measurements
• Programmable constant I source (0-50mA) with dry circuit clamp helps prevent device stress or damage during low resistance measurements

KEITHLEY 2182A NANOVOLTMETER

• The two-channel Model 2182A Nanovoltmeter is optimized for making stable, low noise voltage measurements and for characterizing low resistance materials and devices reliably and repeatably