Code: YOKOGAWA AQ6375B Long Wavelength Optical Spectrum Analyzer 1200 - 2400 nm
Description
High Performance LONG WAVELENGTH
The AQ6375B is a bench-top optical spectrum analyzer covering the long wavelengths, 1200 to 2400 nm, with the added benefits of gas purging input ports / output ports, a built-in cut filter for high order diffracted light, and a novel double speed mode which increases the sweep speed up to 2 times compared to the standard sweep mode.
Features:
Due to the high resolution and sensitivity of the AQ6375B, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR wavelength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.
By continuously supplying a pure purge gas such as nitrogen to the monochromator through the ports on the back panel, the AQ6375B can reduce the influence of water vapor absorptions and provide more reliable and accurate measurements than ever before.
Built-in cut filter for high order diffracted light
Due to the diffractive technology used, the monochromator in some circumstances could generate high order diffracted light, which appears at wavelengths equal to the integral multiple of input wavelengths.
By cutting incoming light below 1150 nm with the built-in filter, the AQ6375B drastically reduces the influence of high order diffracted light on the measurement. Thus, the measured data are always reliable and replicate the real signal under test.
Double speed mode
Increases the sweep speed up to 2 times compared to the standard sweep mode, with only a 2 dB penalty to the standard sensitivity value.
Long Wavelength Range: from 1200nm to 2400nm
The AQ6375B covers not only the wavelength span used in communications, but also the 2µm region which is used for environmental sensing, medical, biology and industrial applications.
High Sensitivity: down to -70dBm
The AQ6375B can measure optical power from +20dBm down to -70dBm thanks to its high-dynamic and very low noise components and circuits used for photo detection. This enables precise measurements of both high power and low power sources.
Measurement sensitivity can be chosen among 7 values according to the measurement speed required by the specific test to be performed.
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